RFR: 8074784: Additional tests for XML DSig API
artem.smotrakov at oracle.com
Wed May 20 20:16:37 UTC 2015
Yes, at first, I thought about updating the existing tests in
test/javax/xml/crypto/dsig directory. But then I noticed that both
GenerationTests and ValidationTests has ~30 test cases. And new
Detached.java test contains >30 test cases. If one of test cases fails,
JTREG will show that full test failed. As a result, it may hide failures
of other test cases (an engineer should look at logs carefully). Also it
may be better to split tests if possible when some tools for automated
failures analysis is used (for example, Java SQE uses such a tool).
That was the main reason why I added a separate test. Not sure if
performance may be an issue, I have not done any measurement.
On 05/20/2015 10:52 PM, Sean Mullan wrote:
> Hi Artem,
> Is there a reason this needs to be a separate test? It seems like it
> would be better to fold it into the existing GenerationTests and
> ValidationTests in the test/javax/xml/crypto/dsig directory, so you
> could reuse common code.
> On 05/12/2015 11:32 AM, Artem Smotrakov wrote:
>> Please review a new test for generating and validation of detached XML
>> digital signatures.
>> Bug: https://bugs.openjdk.java.net/browse/JDK-8074784
>> Webrev: http://cr.openjdk.java.net/~asmotrak/8074784/webrev.00/
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